General approach to the analysis of plasmonic structures using spectroscopic ellipsometry

نویسندگان

  • R. Verre
  • M. Modreanu
  • O. Ualibek
  • D. Fox
  • K. Fleischer
  • C. Smith
  • H. Zhang
  • M. Pemble
  • J. F. McGilp
  • I. V. Shvets
چکیده

R. Verre,1,2,* M. Modreanu,3 O. Ualibek,1 D. Fox,1 K. Fleischer,4 C. Smith,1 H. Zhang,1 M. Pemble,3 J. F. McGilp,4 and I. V. Shvets1,4 1Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN) and School of Physics, Trinity College Dublin, Dublin 2, Ireland 2Department of Applied Physics, Chalmers University of Technology, 412 96 Göteborg, Sweden 3Tyndall National Institute, University College Cork, Lee Maltings, Dyke Parade, Cork, Ireland 4School of Physics, Trinity College Dublin, Dublin 2, Ireland (Received 7 March 2013; published 24 June 2013)

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تاریخ انتشار 2013